منابع مشابه
Studying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملthe scanning electron microscope
it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...
متن کاملStudying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملThe Scanning Optical Microscope
Instead of forming an entire image at one instant, a scanning optical microscope (SOM) scans a beam of light across specimen in a regular pattern, or raster, and forms its image point by point. A point of light is focused to a diffraction-limited spot on the sample by the objective lens. An image is built up point by point by a detector, either below the slide (if the microscope is exclusively ...
متن کاملA scanning cavity microscope
Imaging the optical properties of individual nanosystems beyond fluorescence can provide a wealth of information. However, the minute signals for absorption and dispersion are challenging to observe, and only specialized techniques requiring sophisticated noise rejection are available. Here we use signal enhancement in a high-finesse scanning optical microcavity to demonstrate ultra-sensitive i...
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ژورنال
عنوان ژورنال: IEEJ Transactions on Sensors and Micromachines
سال: 1995
ISSN: 1341-8939,1347-5525
DOI: 10.1541/ieejsmas.115.38